top of page
Wafer Probers
Our Wafer Probers are built for production and analytical applications – failure analysis, device characterisation, thermal testing and parametric testing. All stations are designed for high accuracy, stability and repeatability across MEMS, high power, RF and mmWave test environments.
Every system can be configured with manipulators, enclosures, control software, chucks and microscopes, and upgraded as your requirements grow.
Analytical Wafer Probers
High precision Analytical Wafer Probers in semi-automatic and manual configurations, supporting wafer sizes up to 300mm. Designed for failure analysis, device characterisation and parametric testing, each station can be configured with a full accessory set and upgraded as your requirements grow.

bottom of page


