Bespoke Probing Gear
While standard platforms solve many probing hurdles with basic options, unique technical obstacles often require a more sophisticated approach.
If standard tools fall short, we engineer to your specs. Our experts possess deep tenure crafting specialized wafer test systems for the most rigorous industry environments, ensuring precision performance at a competitive price point.
Our Tailored Solutions
We supply unique systems for MEMS, high-power circuits, and compound semiconductors, plus flexible electronics and MicroLED arrays. Past projects featured delicate wafer handling, specialized chuck hardware, and custom-built integrating spheres for backside illumination. Our engineering team thrives on niche requirements. If your specific testing need is not mentioned, please reach out to our staff. If a technical solution is possible, we will find the way.
Design Cases
Dual-Stage System with 12-inch Integrated Sphere
For a medical imaging client, we developed a system to detect wafer-level failures prior to packaging. By integrating a large sphere beneath the wafer, we facilitated vertical probe card use for high-volume production, ensuring that quality remained consistent throughout the test cycle.
Floating Arm Tool
To address non-standard geometries on large panels, we engineered dual height-sensing probes that operate independently from the main XY chuck. This innovation allows for precise testing along the peripheral edges of oversized semiconductor devices.
Rotational Hub
An optics client required concurrent testing of opposing device faces without visual interference. Our team delivered a 360-degree chuck system that permits sequential side testing while ensuring the overhead detector remains completely clear during the entire measurement process.
MEMS Laser Interface
To accurately capture MEMS deflection data, we integrated specialized laser optics into the wafer prober. We also developed custom software modules to manage the laser interface, providing the user with comprehensive control over the entire measurement environment.