Advanced Wafer Probing
Our specialized probe stations are engineered for meticulous failure analysis and device characterisation. We provide manual and semi-automatic systems supporting wafer sizes through to 300mm.
Customize your setup with our extensive range of manipulators, optical tools, and thermal chucks. Every platform is designed for modularity, allowing for future upgrades as your semiconductor testing requirements evolve.
Semi-Auto 200mm and 300mm Test Units
Experience a versatile semi-automatic solution for 200mm to 300mm wafers, ideal for high voltage, RF, and DC applications. Operating from -60°C to +400°C.
Key features:
• Broad wafer size compatibility
• Precision motor-driven manipulators
• Integrates with cantilever probe cards
• Automated microscope mounting options
• Dedicated software for test routines
• Integrated lasers for wafer marking
High Voltage Semi-Auto 200mm-HV Station
Optimized for power semiconductor validation, this system provides precise, low-resistance measurement even at peak currents. Includes full safety protocols for high voltage use.
Key features:
• High current pulsed and DC probing
• Integrated Kelvin sense tech
• Specialized reverse side contacting
• High voltage and low leakage testing
• Handles thin wafers with precision
• Universal instrument integration
Manual Probing Units 200mm and 300mm Models
A robust, stable manual platform for 200mm and 300mm wafers. An economical choice for failure analysis and process verification.
Key features:
• Support for full or partial wafers
• Wide thermal range: -60°C to +400°C
• High-precision manual stage controls
• Custom shielding enclosures
• Multi-probe and card compatibility
Manual Lab Research Probers
A streamlined, space-saving manual prober for wafers up to 200mm. Designed for easy operation with a clear path for hardware expansion.
Key features:
• 200mm wafer compatibility
• Manual XY stage with theta control
• Thermal and cantilever card ready
• Versatile optical power ranges
• Accelerated probe mode support