Production Wafer Probers

Our Production Wafer Probers offer rapid, reliable probing across a choice of semi-automatic, fully automatic and double-sided platforms. Supporting wafer sizes from 2" to 300mm for full or partial wafers.

All production probers are built around a bespoke controller architecture – a robust, proven platform with straightforward interfacing via TTL, GPIB (IEEE488.2) and RS232. Each system can be fully configured with manipulators, enclosures, antivibration tables, control software, chucks, optics and lasers.

200mm – automatic production prober

Built for high volume probing applications requiring specialist handling. The 200mm automatic probing system handles GaN, GaAs, saw frames and thin wafers, with dual-end parallel processing and cassette-to-cassette automation for maximum throughput.

Key features:

Automatic wafer handling, pattern recognition and probing
Capacity of two cassettes, each holding 25 wafers
Wafer pre-alignment and detection
Configurable to high voltages in excess of 5kV
Optional thermal chuck capability
Pro control and monitoring software

Applications: high volume production, GaN, GaAs, saw frames, thin wafers.

Also available: Pegasus™ A200D for fully automatic double-sided probing.

200mm & 300mm – semi-automatic production probers

An economical platform for rapid testing of full and partial wafers up to 300mm. The S200 supports wafers up to 200mm; the S300 extends to 300mm. Both share the same versatile design and configuration options.

Key features:

Fast probing up to 100mm/sec
Semi-automatic two-point wafer alignment
Active wafer profiling using SSTS probes
Easy integration of cameras and external test equipment
TTL, Ethernet, RS232 and IEEE 488 interfacing
Modular, field-upgradeable design

Applications: production probing, low volume probing, design verification, failure analysis, LEDs, MEMS, packaged components.

Also available: 200mm for semi-automatic double-sided probing.

Double-sided probing

Our double-sided Wafer Probers enable testing at wafer stage that would normally only be possible on packaged devices – providing a precise and efficient way to fully test sophisticated power devices.

We manufacture probe cards specifically for use with the Automated 200mm and Semi Automated 200mm double sided platforms. Based on epoxy PCBs with up to 18 probes, top and bottom cards are aligned using a dowel fixing system to ensure accurate simultaneous contact on the same device.

Prober Accessories

All Production Wafer Probers are supported by a full range of accessories. See our Prober Accessories page for the complete range.