Wafer Probers
Sandy Semiconductor Test Solutions manufactures a comprehensive range of wafer probe stations for production and analytical applications. Whether you need failure analysis, device characterisation, design verification, thermal characterisation or parametric testing, there is a station to suit your requirements.
All probe stations are built for high accuracy, stability and repeatability – making them equally at home in MEMS, high power, RF and mmWave test environments.
Every station can be configured with a full range of accessories including manipulators, enclosures, control software, chucks and microscopes. As your needs evolve, your probe station can be upgraded to match.
Analytical Wafer Probers
High precision Analytical Wafer Probers in semi-automatic and manual configurations, supporting wafer sizes up to 300mm. Designed for failure analysis, device characterisation and parametric testing, each station can be configured with a full accessory set and upgraded as your requirements grow.